Invention Grant
US07672009B2 Systems and methods for providing true scale measurements for digitized drawings
失效
用于为数字化图提供真实尺度测量的系统和方法
- Patent Title: Systems and methods for providing true scale measurements for digitized drawings
- Patent Title (中): 用于为数字化图提供真实尺度测量的系统和方法
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Application No.: US10629347Application Date: 2003-07-28
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Publication No.: US07672009B2Publication Date: 2010-03-02
- Inventor: Victor Ciccarelli
- Applicant: Victor Ciccarelli
- Applicant Address: US NY New York
- Assignee: Archaio, LLC
- Current Assignee: Archaio, LLC
- Current Assignee Address: US NY New York
- Agency: Carter Ledyard & Milburn LLP
- Agent Keith D. Nowak; Libby Babu Varghese
- Main IPC: G06K15/00
- IPC: G06K15/00 ; G06K9/00
Abstract:
The present invention provides a measurement tool for use with an application suited for viewing a digitized drawing. The measurement tool enables the measurement of lengths (of both lines and poly lines) and areas (of both regular and irregular shapes) from a digital drawing in true scale. This is particularly advantageous with original architectural drawings or other drawings that are scanned from paper into a digital format and where measuring or annotating the drawing in true scale is important.
Public/Granted literature
- US20040095588A1 Systems and methods for providing true scale measurements for digitized drawings Public/Granted day:2004-05-20
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