Invention Grant
- Patent Title: Positioning mechanism and microscope using the same
- Patent Title (中): 定位机构和显微镜使用相同
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Application No.: US11791618Application Date: 2005-11-24
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Publication No.: US07672048B2Publication Date: 2010-03-02
- Inventor: Masahiko Tomitori , Toyoko Arai , Yutaka Nakae
- Applicant: Masahiko Tomitori , Toyoko Arai , Yutaka Nakae
- Applicant Address: JP Nomi-Shi, Ishikawa
- Assignee: Japan Advanced Instituter of Science and Technology
- Current Assignee: Japan Advanced Instituter of Science and Technology
- Current Assignee Address: JP Nomi-Shi, Ishikawa
- Agent Manabu Kanesaka
- Priority: JP2004-374829 20041127
- International Application: PCT/JP2005/021582 WO 20051124
- International Announcement: WO2006/057300 WO 20060601
- Main IPC: G02B21/26
- IPC: G02B21/26

Abstract:
A positioning mechanism capable of decreasing width and size and a microscope using the positioning mechanism are provided.The positioning mechanism is provided with a supporting shaft possessing a spherical surface part at a prescribed position and guides disposed substantially parallel to the supporting shaft and is characterized, on the assumption that of the three-dimensional directions, the axial direction of the supporting shaft constitutes the z direction, by the fact that the supporting shaft is nipped by the guides at the position of the spherical surface part and enabled to oscillate on the spherical surface part as a fulcrum in the xy directions and as well slide in the z direction.
Public/Granted literature
- US20080212174A1 Positioning Mechanism and Microscope Using the Same Public/Granted day:2008-09-04
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