Invention Grant
US07672162B2 Non-volatile memory device, memory system, and LSB read method
失效
非易失性存储器件,存储器系统和LSB读取方法
- Patent Title: Non-volatile memory device, memory system, and LSB read method
- Patent Title (中): 非易失性存储器件,存储器系统和LSB读取方法
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Application No.: US12103176Application Date: 2008-04-15
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Publication No.: US07672162B2Publication Date: 2010-03-02
- Inventor: Sang-won Hwang
- Applicant: Sang-won Hwang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2007-0038414 20070419
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A non-volatile memory device and system as well as a LSB read method are disclosed. The LSB read method includes reading LSB data from a memory cell during a main LSB read operation making reference to a flag cell threshold voltage, determining whether the LSB data contains an error, and if the LSB data contains an error re-reading the LSB data during a LSB recover-read operation without making reference to the flag cell threshold voltage.
Public/Granted literature
- US20080259686A1 NON-VOLATILE MEMORY DEVICE, MEMORY SYSTEM, AND LSB READ METHOD Public/Granted day:2008-10-23
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