Invention Grant
US07672366B2 Line quality report accuracy measurement device and accuracy measurement method
有权
线路质量报告精度测量装置及精度测量方法
- Patent Title: Line quality report accuracy measurement device and accuracy measurement method
- Patent Title (中): 线路质量报告精度测量装置及精度测量方法
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Application No.: US10542611Application Date: 2003-12-12
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Publication No.: US07672366B2Publication Date: 2010-03-02
- Inventor: Kenichiro Shinoi , Hidetoshi Suzuki
- Applicant: Kenichiro Shinoi , Hidetoshi Suzuki
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Dickinson Wright PLLC
- Priority: JP2003-016385 20030124
- International Application: PCT/JP03/15944 WO 20031212
- International Announcement: WO2004/066547 WO 20040805
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
A channel quality report accuracy measurement apparatus and accuracy measurement method are provided that correctly measure the accuracy of channel quality reported from a communication apparatus. A scheme control section (140) stores coding rates and modulation schemes corresponding to CQIs, and specifies the transmission scheme corresponding to a fixed CQI reported from a CQI statistical processing section (230). A CQI decoding section (220) decodes a reported CQI contained in a received signal. The CQI statistical processing section (230) performs statistical processing of reported CQIs corresponding to test data transmitted prior to an accuracy measurement test, and reports the most frequently reported CQI to the scheme control section (140) as a fixed CQI. A PER calculation section (260) calculates the PER in the communication apparatus from the reported CQI and Ack/Nack corresponding to test data transmitted in accordance with the fixed CQI. A determination section (270) performs threshold value determination for the PER for each reported CQI value, and outputs the reported CQI scheme determination result.
Public/Granted literature
- US20060056501A1 Line quality report accuracy measurement device and accuracy measurement method Public/Granted day:2006-03-16
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