Invention Grant
US07672805B2 Synchronization of modules for analog and mixed signal testing in an open architecture test system
失效
在开放式架构测试系统中进行模拟和混合信号测试的模块同步
- Patent Title: Synchronization of modules for analog and mixed signal testing in an open architecture test system
- Patent Title (中): 在开放式架构测试系统中进行模拟和混合信号测试的模块同步
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Application No.: US10779031Application Date: 2004-02-13
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Publication No.: US07672805B2Publication Date: 2010-03-02
- Inventor: Eric Barr Kushnick , Kenji Inaba , Toshiyuki Miura
- Applicant: Eric Barr Kushnick , Kenji Inaba , Toshiyuki Miura
- Applicant Address: JP Ora-Gun, Gunma
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Ora-Gun, Gunma
- Agency: Morrison & Foerster LLP
- Main IPC: G01M19/00
- IPC: G01M19/00

Abstract:
A method and apparatus for synchronizing digital and analog/mixed signal modules in a test site of an open architecture test system is disclosed. Event triggers from digital modules are routed to an ASYNC module, which selectively distributes them to analog/mixed signal modules. When an event occurs, the trigger may activate an analog/mixed signal module to perform a certain operation. The ASYNC module may also receive triggers from the analog/mixed signal modules and selectively distribute them back to the digital modules or analog/mixed signal modules. The digital modules can be programmed to wait for an analog/mixed signal module to complete an operation, as indicated by a trigger received from that analog/mixed signal module, before continuing. Because embodiments of the present invention enable synchronization of digital and analog/mixed signal modules under pattern control, synchronization can be very precise and repeatable as compared to synchronization from a site controller.
Public/Granted literature
- US20050114550A1 Synchronization of modules for analog and mixed signal testing in an open architecture test system Public/Granted day:2005-05-26
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