Invention Grant
US07672805B2 Synchronization of modules for analog and mixed signal testing in an open architecture test system 失效
在开放式架构测试系统中进行模拟和混合信号测试的模块同步

Synchronization of modules for analog and mixed signal testing in an open architecture test system
Abstract:
A method and apparatus for synchronizing digital and analog/mixed signal modules in a test site of an open architecture test system is disclosed. Event triggers from digital modules are routed to an ASYNC module, which selectively distributes them to analog/mixed signal modules. When an event occurs, the trigger may activate an analog/mixed signal module to perform a certain operation. The ASYNC module may also receive triggers from the analog/mixed signal modules and selectively distribute them back to the digital modules or analog/mixed signal modules. The digital modules can be programmed to wait for an analog/mixed signal module to complete an operation, as indicated by a trigger received from that analog/mixed signal module, before continuing. Because embodiments of the present invention enable synchronization of digital and analog/mixed signal modules under pattern control, synchronization can be very precise and repeatable as compared to synchronization from a site controller.
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