Invention Grant
- Patent Title: Single event upset test circuit and methodology
- Patent Title (中): 单事件镦粗测试电路和方法
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Application No.: US11529122Application Date: 2006-09-28
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Publication No.: US07673202B2Publication Date: 2010-03-02
- Inventor: Sung Soo Chung
- Applicant: Sung Soo Chung
- Applicant Address: US CA San Jose
- Assignee: Cisco Technology, Inc.
- Current Assignee: Cisco Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: BainwoodHuang
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A method, involving: inputting an initial data pattern into a scan chain circuit of an integrated circuit device; applying a particle beam to the integrated circuit device, while driving the scan chain circuit with a clock signal, to generate an output data pattern; and generating a single event upset error rate test result based on a comparison between the output data pattern and the initial data pattern.
Public/Granted literature
- US20080091996A1 Single event upset test circuit and methodology Public/Granted day:2008-04-17
Information query
