Invention Grant
- Patent Title: Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test
- Patent Title (中): 用于诊断被测系统中的多个故障之间的干扰程度的方法和装置
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Application No.: US11581142Application Date: 2006-10-12
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Publication No.: US07673210B2Publication Date: 2010-03-02
- Inventor: Carl E. Benvenga
- Applicant: Carl E. Benvenga
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method for diagnosing a degree of interference between a plurality of faults in a system under test, the faults being detected by means of applying a test suite to the system under test, includes: 1) for each of the plurality of faults, and for each of a plurality of test syndromes, where a test syndrome is a pattern of passing and failing tests of the test suite, determining relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes; and 2) using the relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes to calculate and display to a user, via a graphical user interface, and for the test suite as a whole, test suite degrees of interference between pairs of the faults. Other embodiments are also disclosed.
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