Invention Grant
US07673210B2 Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test 失效
用于诊断被测系统中的多个故障之间的干扰程度的方法和装置

  • Patent Title: Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test
  • Patent Title (中): 用于诊断被测系统中的多个故障之间的干扰程度的方法和装置
  • Application No.: US11581142
    Application Date: 2006-10-12
  • Publication No.: US07673210B2
    Publication Date: 2010-03-02
  • Inventor: Carl E. Benvenga
  • Applicant: Carl E. Benvenga
  • Applicant Address: US CA Santa Clara
  • Assignee: Agilent Technologies, Inc.
  • Current Assignee: Agilent Technologies, Inc.
  • Current Assignee Address: US CA Santa Clara
  • Main IPC: G06F11/00
  • IPC: G06F11/00
Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test
Abstract:
A method for diagnosing a degree of interference between a plurality of faults in a system under test, the faults being detected by means of applying a test suite to the system under test, includes: 1) for each of the plurality of faults, and for each of a plurality of test syndromes, where a test syndrome is a pattern of passing and failing tests of the test suite, determining relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes; and 2) using the relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes to calculate and display to a user, via a graphical user interface, and for the test suite as a whole, test suite degrees of interference between pairs of the faults. Other embodiments are also disclosed.
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