Invention Grant
US07673280B2 Optical proximity correction (OPC) processing method for preventing the occurrence of off-grid
失效
用于防止离网发生的光学邻近校正(OPC)处理方法
- Patent Title: Optical proximity correction (OPC) processing method for preventing the occurrence of off-grid
- Patent Title (中): 用于防止离网发生的光学邻近校正(OPC)处理方法
-
Application No.: US11841063Application Date: 2007-08-20
-
Publication No.: US07673280B2Publication Date: 2010-03-02
- Inventor: Jae-Hyun Kang
- Applicant: Jae-Hyun Kang
- Applicant Address: KR Seoul
- Assignee: Dongbu HiTek Co., Ltd.
- Current Assignee: Dongbu HiTek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Sherr & Vaughn, PLLC
- Priority: KR10-2006-0080095 20060823
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
An optical proximity correction (OPC) processing method may include at least one of the following steps: Detecting coordinate values of individual piece patterns constituting a graphic design system (GDS). Merging to the form of a specific pattern, composed of outermost coordinate values, on the basis of the detected coordinate values. Shrinking the merged GDS pattern and forming a GDS pattern having a desired magnifying power. Performing an optical proximity correction (OPC) process on the GDS pattern having the desired magnifying power.
Public/Granted literature
- US20080052661A1 OPTICAL PROXIMITY CORRECTION (OPC) PROCESSING METHOD FOR PREVENTING THE OCCURRENCE OF OFF-GRID Public/Granted day:2008-02-28
Information query