Invention Grant
US07673280B2 Optical proximity correction (OPC) processing method for preventing the occurrence of off-grid 失效
用于防止离网发生的光学邻近校正(OPC)处理方法

  • Patent Title: Optical proximity correction (OPC) processing method for preventing the occurrence of off-grid
  • Patent Title (中): 用于防止离网发生的光学邻近校正(OPC)处理方法
  • Application No.: US11841063
    Application Date: 2007-08-20
  • Publication No.: US07673280B2
    Publication Date: 2010-03-02
  • Inventor: Jae-Hyun Kang
  • Applicant: Jae-Hyun Kang
  • Applicant Address: KR Seoul
  • Assignee: Dongbu HiTek Co., Ltd.
  • Current Assignee: Dongbu HiTek Co., Ltd.
  • Current Assignee Address: KR Seoul
  • Agency: Sherr & Vaughn, PLLC
  • Priority: KR10-2006-0080095 20060823
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Optical proximity correction (OPC) processing method for preventing the occurrence of off-grid
Abstract:
An optical proximity correction (OPC) processing method may include at least one of the following steps: Detecting coordinate values of individual piece patterns constituting a graphic design system (GDS). Merging to the form of a specific pattern, composed of outermost coordinate values, on the basis of the detected coordinate values. Shrinking the merged GDS pattern and forming a GDS pattern having a desired magnifying power. Performing an optical proximity correction (OPC) process on the GDS pattern having the desired magnifying power.
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