Invention Grant
US07673583B2 Locally-efficient inductive plasma coupling for plasma processing system
失效
等离子体处理系统的本地效率感应等离子体耦合
- Patent Title: Locally-efficient inductive plasma coupling for plasma processing system
- Patent Title (中): 等离子体处理系统的本地效率感应等离子体耦合
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Application No.: US11278263Application Date: 2006-03-31
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Publication No.: US07673583B2Publication Date: 2010-03-09
- Inventor: Jozef Brcka
- Applicant: Jozef Brcka
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood, Herron & Evans, L.L.P.
- Main IPC: C23C16/00
- IPC: C23C16/00 ; C23F1/00 ; H01L21/306 ; H05B31/26

Abstract:
An inductively coupled plasma source is provided with a peripheral ionization source for producing a high-density plasma in a vacuum chamber for semiconductor wafer coating or etching. The source has a segmented configuration with high and low radiation segments and produces a generally ring-shaped array of energy concentrations in the plasma around the periphery of the chamber. Energy is coupled from a segmented low inductance antenna through a dielectric window or array of windows and through a segmented shield or baffle. An antenna for the source is provided having concentrated conductor segments through which current flows in one or more high efficiency portions that produce high magnetic fields that couple through the high-transparency shield segments into the chamber, while alternating low efficiency conductor segments permit magnetic fields to pass through or between the conductors and deliver only weak fields, which are aligned with opaque shield sections and couple insignificant energy to the plasma. Conductor cross-sectional area or turn density differences may be used to distinguish high and low efficiency sections of the antenna conductor. Coil loops are provided in the high efficiency sections to locally increase inductance.
Public/Granted literature
- US20060254519A1 LOCALLY-EFFICIENT INDUCTIVE PLASMA COUPLING FOR PLASMA PROCESSING SYSTEM Public/Granted day:2006-11-16
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