Invention Grant
US07675015B2 CMOS image sensor with boosted voltage signal and related method of operation
有权
具有升压电压信号的CMOS图像传感器及相关操作方法
- Patent Title: CMOS image sensor with boosted voltage signal and related method of operation
- Patent Title (中): 具有升压电压信号的CMOS图像传感器及相关操作方法
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Application No.: US11267312Application Date: 2005-11-07
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Publication No.: US07675015B2Publication Date: 2010-03-09
- Inventor: Jung-hyun Nam , Jae-seob Rho
- Applicant: Jung-hyun Nam , Jae-seob Rho
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2004-0090364 20041108; KR10-2005-0015544 20050224
- Main IPC: H01L27/00
- IPC: H01L27/00

Abstract:
Provided is a complementary metal oxide semiconductor (CMOS) image sensor. The CMOS image sensor includes a pixel array unit having a matrix-type array of unit pixels, each unit pixel including a charge transfer element transferring charge collected in a photoelectric conversion element to a charge detection element. The charge transfer element also receives a boosted voltage signal higher than an external power voltage.
Public/Granted literature
- US20060097132A1 CMOS image sensor and related method of operation Public/Granted day:2006-05-11
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