Invention Grant
- Patent Title: Method of mass spectrometry and mass spectrometer
- Patent Title (中): 质谱法和质谱仪
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Application No.: US11631033Application Date: 2006-03-08
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Publication No.: US07675033B2Publication Date: 2010-03-09
- Inventor: Yuichiro Hashimoto , Hideki Hasegawa , Takashi Baba , Izumi Waki
- Applicant: Yuichiro Hashimoto , Hideki Hasegawa , Takashi Baba , Izumi Waki
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-315625 20051031
- International Application: PCT/JP2005/304489 WO 20060308
- International Announcement: WO2007/052372 WO 20070510
- Main IPC: H01J49/42
- IPC: H01J49/42

Abstract:
In a mass spectrometer introducing ions produced at an ion source, and including quadrupole rods which have an inlet and an outlet and to which a radio-frequency voltage is applied, the mass spectrometer, i.e., a mass spectrometry device implemented by a linear trap which exhibits high ejection efficiency, high mass resolution, and low ejection energy, executes the following steps: Trapping at least part of the ions by a trap potential generated on the central axis of a quadrupole field, oscillating part of the trapped ions in an intermediate direction between the mutually-adjacent quadrupole rods, ejecting the oscillated ions by an extraction field, and detecting the ejected ions or introducing the ejected ions into another detection process.
Public/Granted literature
- US20090189065A1 Method of mass spectrometry and mass spectrometer Public/Granted day:2009-07-30
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