Invention Grant
US07675036B2 Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points
有权
通过对多个采样点上的脉冲波形进行平均，减少了在三角时域光谱学中的散射相关特征
- Patent Title: Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points
- Patent Title (中): 通过对多个采样点上的脉冲波形进行平均，减少了在三角时域光谱学中的散射相关特征
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Application No.: US11661090Application Date: 2005-08-26
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Publication No.: US07675036B2Publication Date: 2010-03-09
- Inventor: Philip F. Taday , Yao-Chun Shen
- Applicant: Philip F. Taday , Yao-Chun Shen
- Applicant Address: GB Cambridge
- Assignee: Teraview Limited
- Current Assignee: Teraview Limited
- Current Assignee Address: GB Cambridge
- Agency: Dickstein Shapiro LLP
- Priority: GB0419098.9 20040826
- International Application: PCT/GB2005/003333 WO 20050826
- International Announcement: WO2006/021799 WO 20060302
- Main IPC: G01J5/02
- IPC: G01J5/02
Abstract:
A method of investigating an object, comprising the steps of: (a) irradiating the object with an optically-generated pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 100 GHz to 100 THz; (b) detecting radiation transmitted and/or reflected from the object to obtain a time domain waveform; (c) repeating steps (a) and (b) for a plurality of points on the object and (d) combining data from step (c) to produce a time domain waveform for the object which has been averaged over the plurality of points.
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