Invention Grant
US07675037B2 Method and apparatus for measuring terahertz time-domain spectroscopy
有权
用于测量太赫兹时域光谱的方法和装置
- Patent Title: Method and apparatus for measuring terahertz time-domain spectroscopy
- Patent Title (中): 用于测量太赫兹时域光谱的方法和装置
-
Application No.: US11964363Application Date: 2007-12-26
-
Publication No.: US07675037B2Publication Date: 2010-03-09
- Inventor: Yuanjing Li , Bing Feng , Ziran Zhao , Yingxin Wang , Dongmei Yu
- Applicant: Yuanjing Li , Bing Feng , Ziran Zhao , Yingxin Wang , Dongmei Yu
- Applicant Address: CN Beijing CN Beijing
- Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Westman, Champlin & Kelly, P.A.
- Priority: CN200610171670 20061231
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
A method and an apparatus for measuring terahertz time-domain spectrum, which relate to the field of terahertz time-domain spectrum. The method comprises the steps of: generating a first pulse laser beam from a first femtosecond laser device at a preset repetition frequency to generate THz pulses; generating a second pulse laser beam from a second femtosecond laser device at the repetition frequency; measuring electric field intensities of the THz pulses at respective phase differences between the first pulse laser beam and the second pulse laser beam; and obtaining a THz time-domain spectroscopy by performing Fourier transformation of data representative of the electric field intensities. THz spectrum measured according to the method and apparatus improves spectroscopy resolution and provides a broader detection range.
Public/Granted literature
- US20080157750A1 METHOD AND APPARATUS FOR MEASURING TERAHERTZ TIME-DOMAIN SPECTROSCOPY Public/Granted day:2008-07-03
Information query