Invention Grant
US07675131B2 Flip-chip image sensor packages and methods of fabricating the same
有权
倒装片图像传感器封装及其制造方法
- Patent Title: Flip-chip image sensor packages and methods of fabricating the same
- Patent Title (中): 倒装片图像传感器封装及其制造方法
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Application No.: US11784145Application Date: 2007-04-05
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Publication No.: US07675131B2Publication Date: 2010-03-09
- Inventor: James M. Derderian
- Applicant: James M. Derderian
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agent Fletcher Yoder
- Main IPC: H01L31/0232
- IPC: H01L31/0232 ; H01L29/24

Abstract:
There is provided an imager package including an image sensor die attached to a transparent substrate such that sensitive image sensing components on the sensor die face the transparent substrate. In accordance with an embodiment of the present technique, the imager package may be coupled to an external package via bond wires and other interconnect elements. The sensor die and bond wires may be protected by an encapsulant on which the interconnect elements may be disposed. The bond wires may enable placement of the interconnect elements partially or directly above the sensor die, as opposed to around an outer periphery of the sensor die. There is further provided a method of manufacturing an imager package wherein interconnect elements may be located partially or directly above the sensor die, enabling the manufacture of smaller imager packages than previously envisioned.
Public/Granted literature
- US20080246133A1 Flip-chip image sensor packages and methods of fabricating the same Public/Granted day:2008-10-09
Information query
IPC分类: