Invention Grant
- Patent Title: Charged particle beam device probe operation
- Patent Title (中): 带电粒子束装置探头操作
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Application No.: US11957835Application Date: 2007-12-17
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Publication No.: US07675300B2Publication Date: 2010-03-09
- Inventor: Christof Baur , Robert J. Folaron , Adam Hartman , Philip C. Foster , Jay C. Nelson , Richard E. Stallcup, II
- Applicant: Christof Baur , Robert J. Folaron , Adam Hartman , Philip C. Foster , Jay C. Nelson , Richard E. Stallcup, II
- Applicant Address: US TX Richardson
- Assignee: Zyvex Instruments, LLC
- Current Assignee: Zyvex Instruments, LLC
- Current Assignee Address: US TX Richardson
- Agency: Haynes and Boone LLP
- Main IPC: G01R31/305
- IPC: G01R31/305 ; G01R31/02 ; G01R31/26

Abstract:
An apparatus including a positioner control device, a measuring device and a control routine. The positioner control device is communicatively coupled to a chamber of a charged particle beam device (CPBD) and is configured to individually manipulate each of a plurality of probes within the CPBD chamber to establish contact between ones of the plurality of probes and corresponding ones of a plurality of contact points of a sample positioned in the CPBD chamber. The measuring device is communicatively coupled to the CPBD and the positioner control device and is configured to perform one of a measurement and a detection of a characteristic associated with one of the plurality of contact points. The control routine is configured to at least partially automate control of at least one of the CPBD, the positioner control device and the measuring device.
Public/Granted literature
- US20080150557A1 CHARGED PARTICLE BEAM DEVICE PROBE OPERATION Public/Granted day:2008-06-26
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