Invention Grant
- Patent Title: Optical property measuring method and optical property measuring apparatus
- Patent Title (中): 光学性能测量方法和光学性能测量仪器
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Application No.: US11999273Application Date: 2007-12-05
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Publication No.: US07675620B2Publication Date: 2010-03-09
- Inventor: Kenji Imura
- Applicant: Kenji Imura
- Applicant Address: JP Sakai-shi
- Assignee: Konica Minolta Sensing, Inc.
- Current Assignee: Konica Minolta Sensing, Inc.
- Current Assignee Address: JP Sakai-shi
- Agency: Sidley Austin LLP
- Priority: JP2006-331756 20061208
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/46

Abstract:
In an optical property measuring method and an optical property measuring apparatus, a spectral transmittance characteristic of a reference colored layer prepared as a reference is corrected based on a measured spectral reflection characteristic of a colored layer, and the spectral reflection characteristic of the reference colored layer. With this arrangement, information on the measured spectral transmittance characteristic of the colored layer can be obtained with sufficient precision in conformity with a printing condition of a sample to be measured. Thus, colorimetry of a printed color of a fluorescent sample i.e. a colored surface on a fluorescent substrate can be accurately performed by using the corrected spectral transmittance characteristic of the reference colored layer.
Public/Granted literature
- US20080137086A1 Optical property measuring method and optical property measuring apparatus Public/Granted day:2008-06-12
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