Invention Grant
US07675825B2 Method for correcting influence of thickness unevenness of recording medium, information recording/reproducing apparatus using the same method and optical head unit
失效
用于校正记录介质的厚度不均匀的影响的方法，使用相同方法的信息记录/再现装置和光学头单元
- Patent Title: Method for correcting influence of thickness unevenness of recording medium, information recording/reproducing apparatus using the same method and optical head unit
- Patent Title (中): 用于校正记录介质的厚度不均匀的影响的方法，使用相同方法的信息记录/再现装置和光学头单元
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Application No.: US11717639Application Date: 2007-03-14
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Publication No.: US07675825B2Publication Date: 2010-03-09
- Inventor: Hideo Ando
- Applicant: Hideo Ando
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- Priority: JP2001-232633 20010731
- Main IPC: G11B7/00
- IPC: G11B7/00
Abstract:
An optical disk unit of this invention includes a defocus detecting system for detecting a defocus of an objective lens, a thickness unevenness detecting system for detecting a thickness unevenness of a transparent resin layer provided nearest the objective lens of a recording medium, and a thickness unevenness correcting mechanism for changing the focusing characteristic of light impinging upon the objective lens based on a change in the thickness of the transparent resin layer detected by the thickness detecting system.
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Information query
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