Invention Grant
- Patent Title: Method of down-sampling data values
- Patent Title (中): 下采样数据值的方法
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Application No.: US11587028Application Date: 2005-04-21
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Publication No.: US07676099B2Publication Date: 2010-03-09
- Inventor: Arnaud Bourge , Luis Ignacio Escobar Sanz
- Applicant: Arnaud Bourge , Luis Ignacio Escobar Sanz
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP04300232 20040427
- International Application: PCT/IB2005/051313 WO 20050421
- International Announcement: WO2005/104031 WO 20051103
- Main IPC: G06K9/36
- IPC: G06K9/36 ; G06T3/40 ; G06K9/46

Abstract:
The present invention relates to a method of down-sampling data values. A first set of data values comprise a central data value and peripheral values of original data spatially surrounding the central data value. The central and peripheral values are compared to determine whether any differences exceed a threshold. Whenever a difference does exceed a threshold, a clipped value based upon the central data value replaces the corresponding peripheral value, thereby producing a second set of data values.
Public/Granted literature
- US20070206680A1 Method Of Down-Sampling Data Values Public/Granted day:2007-09-06
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