Invention Grant
US07676698B2 Apparatus and method for coupling a plurality of test access ports to external test and debug facility
有权
用于将多个测试访问端口耦合到外部测试和调试设备的装置和方法
- Patent Title: Apparatus and method for coupling a plurality of test access ports to external test and debug facility
- Patent Title (中): 用于将多个测试访问端口耦合到外部测试和调试设备的装置和方法
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Application No.: US11411670Application Date: 2006-04-26
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Publication No.: US07676698B2Publication Date: 2010-03-09
- Inventor: Robert A. McGowan
- Applicant: Robert A. McGowan
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Mirna G. Abyad; Wade J. Brady III; Frederick J. Telecky, Jr.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
An interface unit is provided for selectively testing a plurality of processor/cores. The interface unit includes an interface test access port (TAP) unit operable to receive test commands, and a logic unit coupled to the interface TAP unit and operable to generate control signals based on the received test commands to selectively generate a configuration of TAP units comprised in the plurality of processor/cores to receive test signals.
Public/Granted literature
- US20060277436A1 Apparatus and method for coupling a plurality of test access ports to external test and debug facility Public/Granted day:2006-12-07
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