Invention Grant
US07676698B2 Apparatus and method for coupling a plurality of test access ports to external test and debug facility 有权
用于将多个测试访问端口耦合到外部测试和调试设备的装置和方法

  • Patent Title: Apparatus and method for coupling a plurality of test access ports to external test and debug facility
  • Patent Title (中): 用于将多个测试访问端口耦合到外部测试和调试设备的装置和方法
  • Application No.: US11411670
    Application Date: 2006-04-26
  • Publication No.: US07676698B2
    Publication Date: 2010-03-09
  • Inventor: Robert A. McGowan
  • Applicant: Robert A. McGowan
  • Applicant Address: US TX Dallas
  • Assignee: Texas Instruments Incorporated
  • Current Assignee: Texas Instruments Incorporated
  • Current Assignee Address: US TX Dallas
  • Agent Mirna G. Abyad; Wade J. Brady III; Frederick J. Telecky, Jr.
  • Main IPC: G06F11/00
  • IPC: G06F11/00
Apparatus and method for coupling a plurality of test access ports to external test and debug facility
Abstract:
An interface unit is provided for selectively testing a plurality of processor/cores. The interface unit includes an interface test access port (TAP) unit operable to receive test commands, and a logic unit coupled to the interface TAP unit and operable to generate control signals based on the received test commands to selectively generate a configuration of TAP units comprised in the plurality of processor/cores to receive test signals.
Information query
Patent Agency Ranking
0/0