Invention Grant
US07676717B2 Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit
有权
电子电路包括通过测试链断开保护的测试模式以及相关的电子电路
- Patent Title: Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit
- Patent Title (中): 电子电路包括通过测试链断开保护的测试模式以及相关的电子电路
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Application No.: US11673911Application Date: 2007-02-12
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Publication No.: US07676717B2Publication Date: 2010-03-09
- Inventor: Frédéric Bancel , David Hely
- Applicant: Frédéric Bancel , David Hely
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics SA
- Current Assignee: STMicroelectronics SA
- Current Assignee Address: FR Montrouge
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Agent Lisa K. Jorgenson
- Priority: FR0601180 20060210
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An electronic circuit includes configurable cells with a test input and an output. The configurable cells are capable of being connected to one another in a chain in a predefined order via the test inputs and the outputs to form a test shift register if they receive a chaining command signal. A connection control module disconnects the test input from at least one configurable cell if the connection control module receives an invalid identification key. The connection control module leaves disconnected the test input from the at least one configurable cell, or applies a constant potential on the test input of the at least one configurable cell, or connects the test input of the at least one configurable cell at an output of a random-data generator.
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