Invention Grant
US07676718B2 Test circuit, method and apparatus for supporting circuit design, and computer product 有权
支持电路设计的测试电路,方法和设备,以及计算机产品

  • Patent Title: Test circuit, method and apparatus for supporting circuit design, and computer product
  • Patent Title (中): 支持电路设计的测试电路,方法和设备,以及计算机产品
  • Application No.: US11363216
    Application Date: 2006-02-28
  • Publication No.: US07676718B2
    Publication Date: 2010-03-09
  • Inventor: Toshiyuki Shibuya
  • Applicant: Toshiyuki Shibuya
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Staas & Halsey LLP
  • Priority: JP2005-322336 20051107
  • Main IPC: G06F11/00
  • IPC: G06F11/00 G06F17/50
Test circuit, method and apparatus for supporting circuit design, and computer product
Abstract:
A first FF outputs a first signal. A second FF captures the first signal and outputs a second signal. Each of the first and the second FF has a clock terminal to capture a clock signal. A third FF captures the first signal in parallel with the second FF. The third FF has a clock terminal to capture the clock signal in parallel with the clock terminal of the second FF. A buffer delays arrival of the clock signal to the clock terminal of the third FF. A comparing circuit compares the second signal and the third signal. An error collecting circuit captures a result of comparison to judge whether a timing error occurs in the second FF.
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