Invention Grant
US07676718B2 Test circuit, method and apparatus for supporting circuit design, and computer product
有权
支持电路设计的测试电路,方法和设备,以及计算机产品
- Patent Title: Test circuit, method and apparatus for supporting circuit design, and computer product
- Patent Title (中): 支持电路设计的测试电路,方法和设备,以及计算机产品
-
Application No.: US11363216Application Date: 2006-02-28
-
Publication No.: US07676718B2Publication Date: 2010-03-09
- Inventor: Toshiyuki Shibuya
- Applicant: Toshiyuki Shibuya
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2005-322336 20051107
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F17/50

Abstract:
A first FF outputs a first signal. A second FF captures the first signal and outputs a second signal. Each of the first and the second FF has a clock terminal to capture a clock signal. A third FF captures the first signal in parallel with the second FF. The third FF has a clock terminal to capture the clock signal in parallel with the clock terminal of the second FF. A buffer delays arrival of the clock signal to the clock terminal of the third FF. A comparing circuit compares the second signal and the third signal. An error collecting circuit captures a result of comparison to judge whether a timing error occurs in the second FF.
Public/Granted literature
- US20070124634A1 Test circuit, method and apparatus for supporting circuit design, and computer product Public/Granted day:2007-05-31
Information query