Invention Grant
- Patent Title: Eye optical characteristic measuring apparatus
- Patent Title (中): 眼睛光学特性测量仪器
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Application No.: US11940886Application Date: 2007-11-15
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Publication No.: US07677731B2Publication Date: 2010-03-16
- Inventor: Toshifumi Mihashi , Yoko Hirohara , Takashi Fujikado , Naoyuki Maeda
- Applicant: Toshifumi Mihashi , Yoko Hirohara , Takashi Fujikado , Naoyuki Maeda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Topcon
- Current Assignee: Kabushiki Kaisha Topcon
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2001-271679 20010907
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/00

Abstract:
Scattering can be measured by using an optical system having a Hartman-Shack wave-surface sensor. An eye optical characteristic measuring instrument comprises a light source unit 10 for emitting a light beam of a wavelength in the near-infrared region, an illumination optical system 40 for illuminating a small area of the retinal of an eye to be measured with the light beam from the light source unit 10, a light-receiving optical system 20 for receiving a part of the reflected beam of the light beam from the light source unit 10 reflected from the retina through a converting member for converting the part of the reflected light beam into at least substantially 17 light beams, a light-receiving section 23 for receiving the received light beam directed by the light-receiving optical system 20 and generating a signal, and a calculating unit for determining the wavefront aberration of the light beam entering the light-receiving optical system 20 and the degree of scattering of the received light beam on the basis of the signal from the light-receiving section 23.
Public/Granted literature
- US20080123053A1 EYE OPTICAL CHARACTERISTIC MEASURING APPARATUS Public/Granted day:2008-05-29
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