Invention Grant
- Patent Title: Method for characterizing a surface, and device therefor
- Patent Title (中): 表面表征方法及其装置
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Application No.: US11592221Application Date: 2006-11-03
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Publication No.: US07678584B2Publication Date: 2010-03-16
- Inventor: Philippe Guedon , Yves Levy
- Applicant: Philippe Guedon , Yves Levy
- Applicant Address: FR Orsay
- Assignee: Institut d'Optique Theorique et Appliquee
- Current Assignee: Institut d'Optique Theorique et Appliquee
- Current Assignee Address: FR Orsay
- Agency: Oliff & Berridge, PLC
- Priority: FR0016247 20001213; FR0016248 20001213
- Main IPC: G01N33/552
- IPC: G01N33/552
Abstract:
The present invention relates to a method of characterizing a surface and to a device for implementing this method. In particular, this method makes it possible to measure, qualitatively and/or quantitatively, interactions that may be physical, chemical, biochemical or biological.
Public/Granted literature
- US20070054392A1 Method for characterizing a surface, and device therefor Public/Granted day:2007-03-08
Information query
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