Invention Grant
- Patent Title: Integrated circuit edge protection method and apparatus
- Patent Title (中): 集成电路边缘保护方法和装置
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Application No.: US12062400Application Date: 2008-04-03
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Publication No.: US07678613B2Publication Date: 2010-03-16
- Inventor: Lee Peng Khaw , Kam Meng Chong , Diego Diaz , Zhiyong Wang , Zezhong Fu
- Applicant: Lee Peng Khaw , Kam Meng Chong , Diego Diaz , Zhiyong Wang , Zezhong Fu
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01L21/58
- IPC: H01L21/58 ; H01L21/56 ; H01L23/13 ; H01L23/31 ; H01L23/32

Abstract:
An apparatus, method, and system for providing a mechanical divider adapted to shield at least a portion of an active surface of an integrated circuit from out-gassing from underfill material. The mechanical divider is attached to a mounting substrate. The underfill material is dispensed on the mounting substrate. The integrated circuit is placed on both the mechanical divider and on the underfill material after the mechanical divider has been at least partially cured. The mechanical divider may include a base surface adapted to contact the mounting substrate, a lower wall surface extending upwardly from the base surface, an upper wall surface adapted to abut a side wall of the integrated circuit, and a ledge surface extending between the lower wall surface and the upper wall surface, the ledge surface adapted to contact at least a portion of the active surface of the integrated circuit.
Public/Granted literature
- US20080188038A1 INTEGRATED CIRCUIT EDGE PROTECTION METHOD AND APPARATUS Public/Granted day:2008-08-07
Information query
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