Method and system for forming a thin film device

Invention Grant

US07678626B2 Method and system for forming a thin film device 有权

Title translation: 用于形成薄膜器件的方法和系统

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Patent Title: Method and system for forming a thin film device
Patent Title (中): 用于形成薄膜器件的方法和系统
Application No.: US11285879

Application Date: 2005-11-23
Publication No.: US07678626B2

Publication Date: 2010-03-16
Inventor: Craig M. Perlov , Ping Mei
Applicant: Craig M. Perlov , Ping Mei
Applicant Address: US TX Houston
Assignee: Hewlett-Packard Development Company, L.P.
Current Assignee: Hewlett-Packard Development Company, L.P.
Current Assignee Address: US TX Houston
Main IPC: H01L21/8234
IPC: H01L21/8234

Method and system for forming a thin film device

Abstract:

A method of forming a thin film device on a flexible substrate is disclosed. The method includes depositing an imprintable material over the flexible substrate. The imprintable are stamped material forming a three-dimensional pattern in the imprintable material. A sacrificial layer is formed over the three-dimensional pattern. A conductive layer is deposited over the sacrificial layer. The sacrificial layer is removed, leaving portions of the conductive layer as defined by the three-dimensional pattern.

Abstract(Chinese):

公开了一种在柔性基板上形成薄膜器件的方法。该方法包括将可压印材料沉积在柔性基底上。可压印的是在可压印材料中形成三维图案的冲压材料。在三维图案上形成牺牲层。在牺牲层上沉积导电层。去除牺牲层，使得由三维图案限定的部分导电层。

Public/Granted literature

US20070117278A1 Formation of devices on a substrate Public/Granted day:2007-05-24

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/70	.由在一共用基片内或其上形成的多个固态组件或集成电路组成的器件或其部件的制造或处理；集成电路器件或其特殊部件的制造（由预制电组件组成的组装件的制造入H05K3/00，H05K13/00）
H01L21/77	..在公共衬底中或上面形成的由许多固态元件或集成电路组成的器件的制造或处理（电可编程只读存储器或其多步骤的制造方法入H01L27/115）
H01L21/78	...把衬底连续地分成多个独立的器件（改变表面物理特性或者半导体形状的切割入H01L21/304）
H01L21/82	....制造器件，例如每一个由许多元件组成的集成电路
H01L21/822	.....衬底是采用硅工艺的半导体的（H01L21/8258优先）
H01L21/8232	......场效应工艺
H01L21/8234	.......MIS工艺