Invention Grant
- Patent Title: FinFET device with gate electrode and spacers
- Patent Title (中): FinFET器件,带栅极和间隔物
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Application No.: US12349062Application Date: 2009-01-06
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Publication No.: US07679135B2Publication Date: 2010-03-16
- Inventor: Thomas Schulz
- Applicant: Thomas Schulz
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L29/772
- IPC: H01L29/772

Abstract:
A semiconductor device includes a source region, a drain region, and a fin that connects the source region to the drain region. A gate electrode having a substantially planar surface overlies the fin and is positioned between the drain region and the source region. A first set of spacers is positioned between a first sidewall of the gate electrode and the source region and between a second sidewall of the gate electrode and the drain region. A second set of spacers is positioned on at least a portion of a top surface of the source region and the drain region and alongside at least a portion of the first set of spacers. At least a portion of sidewalls of the second set of spacers contacts a portion of the first or second sidewall of the gate electrode.
Public/Granted literature
- US20090114979A1 FinFET Device with Gate Electrode and Spacers Public/Granted day:2009-05-07
Information query
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