Invention Grant
- Patent Title: Method for manufacturing a semiconductor component and a semiconductor component, in particular a diaphragm sensor
- Patent Title (中): 用于制造半导体部件和半导体部件的方法,特别是膜片传感器
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Application No.: US12001289Application Date: 2007-12-10
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Publication No.: US07679154B2Publication Date: 2010-03-16
- Inventor: Hubert Benzel , Heribert Weber , Hans Artmann , Thorsten Pannek , Frank Schäfer
- Applicant: Hubert Benzel , Heribert Weber , Hans Artmann , Thorsten Pannek , Frank Schäfer
- Applicant Address: DE Stuttgart
- Assignee: Robert Bosch GmbH
- Current Assignee: Robert Bosch GmbH
- Current Assignee Address: DE Stuttgart
- Agency: Kenyon & Kenyon LLP
- Priority: DE10138759 20010807
- Main IPC: H01L29/84
- IPC: H01L29/84

Abstract:
In a method for manufacturing a semiconductor component having a semiconductor substrate, a flat, porous diaphragm layer and a cavity underneath the porous diaphragm layer are produced to form unsupported structures for a component. In a first approach, the semiconductor substrate may receive a doping in the diaphragm region that is different from that of the cavity. This permits different pore sizes and/or porosities to be produced, which is used in producing the cavity for improved etching gas transport. Also, mesopores may be produced in the diaphragm region and nanopores may be produced as an auxiliary structure in what is to become the cavity region.
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