Invention Grant
- Patent Title: Semiconductor device having a bump formed over an electrode pad
- Patent Title (中): 具有在电极焊盘上形成的凸块的半导体器件
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Application No.: US11487421Application Date: 2006-07-17
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Publication No.: US07679188B2Publication Date: 2010-03-16
- Inventor: Takao Nishimura
- Applicant: Takao Nishimura
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Microelectronics Limited
- Current Assignee: Fujitsu Microelectronics Limited
- Current Assignee Address: JP Yokohama
- Agency: Fujitsu Patent Center
- Priority: JP2006-028860 20060206
- Main IPC: H01L23/52
- IPC: H01L23/52

Abstract:
To provide a high-performance, highly-reliable semiconductor device in which an adhesive used to mount (e.g., flip-chip mount) a semiconductor chip on a substrate has less air bubbles, and a low-cost, efficient method for manufacturing the same. Semiconductor device 10 of the present invention includes semiconductor chip 11 having a plurality of electrode pads 12, and substrate 14 having a plurality of electrode terminals 15 at positions corresponding to electrode pads 12. A plurality of bumps 13, each composed of base part 13A and protruding part 13B having a diameter smaller than the diameter of base part 13A, is formed on at least one of electrode pads 12 in such a way that the respective base parts 13A of bumps 13 are in contact with each other, and semiconductor chip 11 is bonded to substrate 14 with adhesive 17 in a state where bumps 13 are electrically connected to electrode terminals 15.
Public/Granted literature
- US20070182019A1 Semiconductor device and manufacturing method for the same Public/Granted day:2007-08-09
Information query
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