Invention Grant
US07679377B2 Measuring apparatus and method for determining a dielectric property, in particular moisture and/or density, in a product 失效
用于确定产品中的介电特性,特别是水分和/或密度的测量装置和方法

  • Patent Title: Measuring apparatus and method for determining a dielectric property, in particular moisture and/or density, in a product
  • Patent Title (中): 用于确定产品中的介电特性,特别是水分和/或密度的测量装置和方法
  • Application No.: US11793947
    Application Date: 2005-12-17
  • Publication No.: US07679377B2
    Publication Date: 2010-03-16
  • Inventor: Dierk Schröder
  • Applicant: Dierk Schröder
  • Applicant Address: DE Hamburg
  • Assignee: Hauni Maschinenbau Ag
  • Current Assignee: Hauni Maschinenbau Ag
  • Current Assignee Address: DE Hamburg
  • Agency: Venable LLP
  • Agent Robert Kinberg; Kyle D. Petaja
  • Priority: DE102004063228 20041222
  • International Application: PCT/EP2005/013831 WO 20051217
  • International Announcement: WO2006/069721 WO 20060706
  • Main IPC: G01R27/26
  • IPC: G01R27/26
Measuring apparatus and method for determining a dielectric property, in particular moisture and/or density, in a product
Abstract:
The application concerns a measuring apparatus for determining a dielectric property, in particular the moisture and/or density, of a product, in particular tobacco, Cotton or some other fibrous product, having a measuring capacitor, a device for generating a high-frequency field in the measuring capacitor, which is influenced by a product which is arranged in a measuring volume of the measuring apparatus, and having a circuit device which includes the measuring capacitor and which is designed to determine suitable measurable variables of the high-frequency field influenced by the product, and is distinquished in that the circuit device is substantially non-resonant at the measuring frequency of the high-frequency field that is used, and measurement is based on the propagation of a travelling high-frequency wave in the measuring capacitor, and the circuit device is designed to determine two mutually independent measurable variables which are dependent on the amplitude and phase of the high-frequency wave influenced by the product. The application further concerns a corresponding measuring method.
Information query
Patent Agency Ranking
0/0