Invention Grant
- Patent Title: Crystal oscillator tester
- Patent Title (中): 水晶振荡器测试仪
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Application No.: US12212659Application Date: 2008-09-18
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Publication No.: US07679460B2Publication Date: 2010-03-16
- Inventor: Xiang Cao
- Applicant: Xiang Cao
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Zhigang Ma
- Priority: CN200810303656 20080811
- Main IPC: H03B1/00
- IPC: H03B1/00 ; G01R29/22 ; G01R23/00

Abstract:
A crystal oscillator tester includes first and second test pins, first and second transistors, an indicator, a first diode, and first-third capacitors. The first test pin is connected to a power source. The collector of the first transistor is connected to the first test pin. The base of the second transistor is connected to the second test pin. The emitter of the first transistor is grounded via the indicator. The base of the first transistor is connected to the cathode of the first diode. The anode of the first diode is connected to the first test pin via the first and second capacitors one by one in series. The emitter of the second transistor is connected to a node between the first and second capacitors. The collector of the second transistor is grounded. The third capacitor is connected between the base and emitter of the second transistor.
Public/Granted literature
- US20100033254A1 CRYSTAL OSCILLATOR TESTER Public/Granted day:2010-02-11
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