Invention Grant
- Patent Title: Gloss measurement apparatus and gloss measurement method
- Patent Title (中): 光泽测量装置和光泽度测量方法
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Application No.: US11371160Application Date: 2006-03-09
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Publication No.: US07679747B2Publication Date: 2010-03-16
- Inventor: Yoshitaka Kuwada
- Applicant: Yoshitaka Kuwada
- Applicant Address: JP Tokyo
- Assignee: Fuji Xerox Co., Ltd.
- Current Assignee: Fuji Xerox Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2005-067923 20050310; JP2005-336340 20051121
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A gloss measurement apparatus which emits light from a light source and finds an evaluation value, which represents a glossiness of an object to be measured, on the basis of specular reflected light which is reflected by the object to be measured. The gloss measurement apparatus is provided with an acquisition component, a pixel gloss value calculation component and an evaluation value calculation component. The acquisition component acquires image information in accordance with received light amounts, at predetermined respective pixels, of specular reflected light from a surface of the object to be measured. The pixel gloss value calculation component calculates gloss values of the respective pixels on the basis of the received light amounts at the respective pixels of the image information acquired by the acquisition component. The evaluation value calculation component calculates the evaluation value representing the glossiness of the object to be measured on the basis of the gloss values calculated by the pixel gloss value calculation component.
Public/Granted literature
- US20060256341A1 Gloss measurement apparatus and gloss measurement method Public/Granted day:2006-11-16
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