Invention Grant
US07679803B2 Two-element f-θ lens used for micro-electro mechanical system (MEMS) laser scanning unit
失效
两元素f-&thetas; 用于微机电系统(MEMS)激光扫描单元的透镜
- Patent Title: Two-element f-θ lens used for micro-electro mechanical system (MEMS) laser scanning unit
- Patent Title (中): 两元素f-&thetas; 用于微机电系统(MEMS)激光扫描单元的透镜
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Application No.: US12419066Application Date: 2009-04-06
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Publication No.: US07679803B2Publication Date: 2010-03-16
- Inventor: Bo-Yuan Shih , Shon-Woei Shyu
- Applicant: Bo-Yuan Shih , Shon-Woei Shyu
- Applicant Address: TW Taipei
- Assignee: E-Pin Optical Industry Co., Ltd.
- Current Assignee: E-Pin Optical Industry Co., Ltd.
- Current Assignee Address: TW Taipei
- Agency: WPAT, P.C.
- Agent Anthony King; Kay Yang
- Priority: TW97129648A 20080805
- Main IPC: G02B26/08
- IPC: G02B26/08

Abstract:
A two-element f-θ lens used for a micro-electro mechanical system (MEMS) laser scanning unit includes a first lens and a second lens, the first lens is a positive power meniscus lens of which concave surface is disposed on a side of a MEMS mirror, the second lens is a negative power meniscus lens of which convex surface is disposed on the side of the MEMS mirror, at least one optical surface is an Aspherical surface in both main scanning direction and sub scanning direction, and satisfies special optical conditions. The two-element f-θ lens corrects the nonlinear relationship between scanned angle and time into the linear relationship between the image spot distances and time. Meanwhile, the two-element f-θ lens focuses the scan light to the target in the main scanning and sun scanning directions, such that the purpose of the scanning linearity effect and the high resolution scanning can be achieved.
Public/Granted literature
- US20100033792A1 TWO-ELEMENT F-THETA LENS USED FOR MICRO-ELECTRO MECHANICAL SYSTEM (MEMS) LASER SCANNING UNIT Public/Granted day:2010-02-11
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