Invention Grant
- Patent Title: Power overload detection method and structure therefor
- Patent Title (中): 电力过载检测方法及其结构
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Application No.: US11188093Application Date: 2005-07-25
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Publication No.: US07679874B2Publication Date: 2010-03-16
- Inventor: George H. Barbehenn , John D. Stone
- Applicant: George H. Barbehenn , John D. Stone
- Applicant Address: US AZ Phoenix
- Assignee: Semiconductor Components Industries, L.L.C.
- Current Assignee: Semiconductor Components Industries, L.L.C.
- Current Assignee Address: US AZ Phoenix
- Agent Robert F. Hightower
- Main IPC: H02H3/00
- IPC: H02H3/00
Abstract:
In one embodiment, the bulk input voltage is used to form a reference signal that is used for controlling a switching power supply system to operate in a power overload operating mode.
Public/Granted literature
- US20070019343A1 Power overload detection method and structure therefor Public/Granted day:2007-01-25
Information query
