Invention Grant
- Patent Title: Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals
- Patent Title (中): 通过分析降级遥测信号进行实时根本原因分析的方法和装置
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Application No.: US11787506Application Date: 2007-04-16
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Publication No.: US07680624B2Publication Date: 2010-03-16
- Inventor: David K. McElfresh , Dan Vacar , Kenny C. Gross , Leoncio D. Lopez
- Applicant: David K. McElfresh , Dan Vacar , Kenny C. Gross , Leoncio D. Lopez
- Applicant Address: US CA Santa Clara
- Assignee: Sun Microsystems, Inc.
- Current Assignee: Sun Microsystems, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Park, Vaughan & Fleming LLP
- Main IPC: G01V9/00
- IPC: G01V9/00

Abstract:
One embodiment of the present invention provides a system that performs a real-time root-cause-analysis for a degradation event associated with a component under test. During operation, the system monitors a telemetry signal collected from the component, and while doing so, attempts to detect an anomaly in the telemetry signal. If an anomaly is detected in the telemetry signal, the system performs a failure analysis on the telemetry signal in real-time while the telemetry signal is degrading. Next, the system identifies a failure mechanism for the component based on the failure analysis.
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