Invention Grant
- Patent Title: Calibrating force and displacement sensors of mechanical probes
- Patent Title (中): 机械探头的校准力和位移传感器
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Application No.: US11609523Application Date: 2006-12-12
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Publication No.: US07681432B2Publication Date: 2010-03-23
- Inventor: Jennifer Hay , Warren Oliver
- Applicant: Jennifer Hay , Warren Oliver
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01B3/30
- IPC: G01B3/30

Abstract:
Concepts presented herein relate to a portable device that includes a frame and a fixture for engaging a mechanical probe to be calibrated. The fixture can be a platform of hard material that receives pushing action of the mechanical probe. A displacement sensor senses position of the platform with respect to the frame. An actuator is coupled to the displacement sensor and a controller is coupled to the actuator. The controller operates the actuator to cause the platform to move to a position (as indicated by the displacement sensor), while the force required to cause the displacement is measured with a force sensor.
Public/Granted literature
- US20080134748A1 CALIBRATING FORCE AND DISPLACEMENT SENSORS OF MECHANICAL PROBES Public/Granted day:2008-06-12
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