Invention Grant
- Patent Title: Refined infection monitoring
- Patent Title (中): 精细感染监测
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Application No.: US11737176Application Date: 2007-04-19
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Publication No.: US07682355B2Publication Date: 2010-03-23
- Inventor: Martin T. Gerber , John C. Rondoni
- Applicant: Martin T. Gerber , John C. Rondoni
- Applicant Address: US MN Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: US MN Minneapolis
- Agency: Campbell Nelson Whipps, LLC
- Main IPC: A61K9/22
- IPC: A61K9/22

Abstract:
A method for monitoring infection in proximity to an implanted medical device includes monitoring an indicator of infection in proximity to the device and determining whether a value associated the indicator of infection crosses a first threshold indicative of infection. The method further includes detecting an event associated with the device. The event is capable of affecting the indicator of infection. The method also includes determining whether the value associated with the indicator of infection crosses a second threshold indicative of infection if the event is detected. The method may further include issuing an alert if (i) the first threshold is crossed and the event is not detected, or (ii) the second threshold is crossed and the event is detected.
Public/Granted literature
- US20080262379A1 REFINED INFECTION MONITORING Public/Granted day:2008-10-23
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