Invention Grant
- Patent Title: Sensor unit for assay in utilizing attenuated total reflection
- Patent Title (中): 利用衰减全反射测量的传感器单元
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Application No.: US11333207Application Date: 2006-01-18
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Publication No.: US07682566B2Publication Date: 2010-03-23
- Inventor: Hisashi Ohtsuka
- Applicant: Hisashi Ohtsuka
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2005-010543 20050118
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/64 ; G01N30/96 ; G01N21/55 ; G01J3/00 ; C12M1/34

Abstract:
A surface plasmon resonance assay apparatus is loaded with a sensor unit. A sensing surface of a thin film detects reaction of a sample. A dielectric prism is overlaid with the thin film to constitute an interface. A reflection angle upon occurrence of attenuated total reflection of the illuminating light is changeable according to reaction of the sample on the sensing surface. Protecting panels are disposed to face outer surfaces of the prism, for covering and protecting at least partially the outer surfaces. A first window in one of the protecting panels is positioned on a path of the illuminating light traveling for incidence on the interface, for passing the illuminating light. A second window in one remaining protecting panel is positioned on a path of the illuminating light traveling upon reflection by the interface, for passing the illuminating light.
Public/Granted literature
- US20060159591A1 Sensor unit for assay in utilizing attenuated total reflection Public/Granted day:2006-07-20
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