Invention Grant
- Patent Title: Germanium doped n-type aluminum nitride epitaxial layers
- Patent Title (中): 锗掺杂n型氮化铝外延层
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Application No.: US08550195Application Date: 1995-10-30
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Publication No.: US07682709B1Publication Date: 2010-03-23
- Inventor: Robert F. Davis , Cheng Wang
- Applicant: Robert F. Davis , Cheng Wang
- Applicant Address: US NC Raleigh
- Assignee: North Carolina State University
- Current Assignee: North Carolina State University
- Current Assignee Address: US NC Raleigh
- Agent Philip Summa
- Main IPC: B32B18/00
- IPC: B32B18/00

Abstract:
A method of preparing an n-type epitaxial layer of aluminum nitride conductively doped with germanium comprises directing a molecular beam of aluminum atoms onto the growth surface of a substrate that provides an acceptable lattice match for aluminum nitride; directing a molecular beam of activated nitrogen to the growth surface of the substrate; and directing a molecular beam of germanium to the growth surface of the substrate; while maintaining the growth surface of the substrate at a temperature high enough to provide the surface mobility and sticking coefficient required for epitaxial growth, but lower than the temperature at which the surface would decompose or the epitaxial layer disassociate back into atomic or molecular species.
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