Invention Grant
- Patent Title: Phase change alloy etch
- Patent Title (中): 相变合金蚀刻
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Application No.: US11479303Application Date: 2006-06-29
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Publication No.: US07682979B2Publication Date: 2010-03-23
- Inventor: Qian Fu , Shenjian Liu , Linda Fung-Ming Lee
- Applicant: Qian Fu , Shenjian Liu , Linda Fung-Ming Lee
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Beyer Law Group LLP
- Main IPC: H01L21/3065
- IPC: H01L21/3065

Abstract:
A method of forming devices is provided. A phase change layer is provided. The phase change layer is etched by providing an etch gas comprising a bromine containing compound and forming a plasma from the etch gas. The phase change layer is of a material that may be heated by a current and then when cooled, either forms an amorphous material or a crystalline material, depending on how fast the material is cooled. In addition, the amorphous material has a resistance at least several times greater than the crystalline material.
Public/Granted literature
- US20090130855A1 Phase change alloy etch Public/Granted day:2009-05-21
Information query
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