Invention Grant
- Patent Title: Charge control apparatus and measurement apparatus equipped with the charge control apparatus
- Patent Title (中): 装有充电控制装置的充电控制装置和测量装置
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Application No.: US11338843Application Date: 2006-01-25
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Publication No.: US07683319B2Publication Date: 2010-03-23
- Inventor: Hiroshi Makino , Zhaohui Cheng , Kenji Tanimoto , Hideo Todokoro
- Applicant: Hiroshi Makino , Zhaohui Cheng , Kenji Tanimoto , Hideo Todokoro
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-017596 20050126; JP2005-298311 20051013
- Main IPC: H01J37/256
- IPC: H01J37/256

Abstract:
The invention solves charge nonuniformity of a specimen surface resulting from emission variation of a carbon nanotube electron source and individual difference of emission characteristics. During charge control processing, charge of the specimen surface is measured in real time. As means for solving charge nonuniformity resulting from nonuniformity of electron illumination density, electrons illuminating the specimen and the specimen are moved relatively to average electron illumination density. Moreover, an absorption current flowing into the specimen and the numbers of secondary electrons emitted from the specimen and of backscattered electrons are measured as means for monitoring charge of the specimen surface in real time.
Public/Granted literature
- US20090166557A1 Charge control apparatus and measurement apparatus equipped with the charge control apparatus Public/Granted day:2009-07-02
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