Invention Grant
- Patent Title: Electronic device with connection bumps
- Patent Title (中): 带连接凸块的电子设备
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Application No.: US11671048Application Date: 2007-02-05
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Publication No.: US07683483B2Publication Date: 2010-03-23
- Inventor: Radu M. Secareanu , Suman K. Banerjee , Olin L. Hartin , Sandra J. Wipf
- Applicant: Radu M. Secareanu , Suman K. Banerjee , Olin L. Hartin , Sandra J. Wipf
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Ingrassia, Fisher & Lorenz, P.C.
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L29/00

Abstract:
Flip-chip electronic devices (40, 70, 80, 90) employ bumps (42, 72, 82) for coupling to an external substrate. Device cells (43, 73, 83, 93) and bumps (42, 72, 82) are preferably arranged in clusters (46) where four bumps (42, 72, 82) substantially surround each device cell (43, 73, 83, 93) or form a cross with the device cell (43, 73, 83, 93) at the intersection of the cross. The bumps (42, 72, 82) are desirably spaced apart by the minimum allowable bump (42, 72, 82) pitch (Lm). Typically, each device cell (43, 73, 83, 93) contains one or more active device regions (44, 74, 86, 96) depending on the overall function. Complex devices (40, 70) are formed by an X-Y array of the clusters (46), where adjacent clusters (46) may share bumps (43, 73, 83, 93) and/or device cells (43, 73, 83, 93). In a preferred embodiment, the bumps (42, 82) form the outer perimeter (48) of the device (40, 80, 90). The maximum device temperature and overall noise is reduced.
Public/Granted literature
- US20080185686A1 ELECTRONIC DEVICE WITH CONNECTION BUMPS Public/Granted day:2008-08-07
Information query
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