Invention Grant
- Patent Title: Misalignment detection devices
- Patent Title (中): 未对准检测装置
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Application No.: US11535141Application Date: 2006-09-26
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Publication No.: US07683496B2Publication Date: 2010-03-23
- Inventor: Chun-Yu Lee , Shih-Ping Chou , Chien-Liang Chen , Wen-Hung Lai
- Applicant: Chun-Yu Lee , Shih-Ping Chou , Chien-Liang Chen , Wen-Hung Lai
- Applicant Address: TW Hsinchu
- Assignee: AU Optronics Corp.
- Current Assignee: AU Optronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Thomas, Kayden, Horstemeyer & Risley
- Priority: TW95124605A 20060706
- Main IPC: H01L23/544
- IPC: H01L23/544

Abstract:
A misalignment detection device comprising a substrate, at least one integrated circuit (IC), and at least one detection unit is disclosed. The substrate comprises a first positioning pad and a second positioning pad adjacent to the first positioning pad. The integrated circuit is disposed on the substrate and comprises a first positioning bump and a second positioning bump adjacent to the first positioning bump. The first and second positioning bumps substantially correspond to the first and second positioning pads, respectively. The at least one detection unit is electrically coupled to the substrate, wherein the detection unit outputs a fault signal in response to a positioning shift occurring between the first and second positioning pads and the first and second positioning bumps.
Public/Granted literature
- US20080006952A1 MISALIGNMENT DETECTION DEVICES Public/Granted day:2008-01-10
Information query
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