Invention Grant
- Patent Title: Semiconductor device with voltage variation detector
- Patent Title (中): 具有电压变动检测器的半导体器件
-
Application No.: US10584620Application Date: 2004-11-10
-
Publication No.: US07683591B2Publication Date: 2010-03-23
- Inventor: Eiichi Sadayuki , Jun Horikawa
- Applicant: Eiichi Sadayuki , Jun Horikawa
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Steptoe & Johnson LLP
- Priority: JP2003-434075 20031226
- International Application: PCT/JP2004/016644 WO 20041110
- International Announcement: WO2005/066733 WO 20050721
- Main IPC: G05F1/00
- IPC: G05F1/00

Abstract:
A semiconductor device includes a comparator which includes two input terminals and compares the voltage values between the power supply voltage which is inputted to one side input terminal and the reference voltage which is inputted to the other side input terminal. A resistor element connects two signal lines that are connected to the input terminals of the comparator One end of a capacitance element is connected to a power supply terminal for applying a power supply and the other end is connected to one input terminal of the comparator.
Public/Granted literature
- US20070146017A1 Semiconductor device Public/Granted day:2007-06-28
Information query
IPC分类: