Invention Grant
US07683608B2 Handler comprising an acceleration device for testing electronic components
有权
处理器包括用于测试电子元件的加速装置
- Patent Title: Handler comprising an acceleration device for testing electronic components
- Patent Title (中): 处理器包括用于测试电子元件的加速装置
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Application No.: US11990748Application Date: 2007-05-24
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Publication No.: US07683608B2Publication Date: 2010-03-23
- Inventor: Arnfried Kiermeier , Michael Klier , Josef Mühlbauer
- Applicant: Arnfried Kiermeier , Michael Klier , Josef Mühlbauer
- Applicant Address: DE Rosenheim
- Assignee: Multitest Elektronische Systeme GmbH
- Current Assignee: Multitest Elektronische Systeme GmbH
- Current Assignee Address: DE Rosenheim
- Agency: Nixon & Vanderhye PC
- Priority: DE102006025341 20060531
- International Application: PCT/EP2007/004644 WO 20070524
- International Announcement: WO2007/137768 WO 20071206
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
The technology herein relates to a handler for testing electronic components, said handler comprising an acceleration device provided with a tappet which is linearly guided by means of at least one flat spring comprising two groups of spring arms, one group being fixed to the tappet and the other group to a frame which is stationary in relation to a housing of the movement generation device. Handler comprising an acceleration device for testing electronic components.
Public/Granted literature
- US20090241676A1 Handler comprising an acceleration device for testing electronic components Public/Granted day:2009-10-01
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