Invention Grant
- Patent Title: Circuit tester device
- Patent Title (中): 电路测试仪
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Application No.: US11763482Application Date: 2007-06-15
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Publication No.: US07683629B2Publication Date: 2010-03-23
- Inventor: Scotty R. Kurtz
- Applicant: Scotty R. Kurtz
- Applicant Address: US IA Clarinda
- Assignee: Lisle Corporation
- Current Assignee: Lisle Corporation
- Current Assignee Address: US IA Clarinda
- Agency: Banner & Witcoff, Ltd.
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/08

Abstract:
A circuit tester in the form of a pliers includes first and second jaws with first and second probes respectively for engaging a wire to confirm circuit continuity and polarity. The probes are electrically connected in series with a bipolar or two color, light emitting diode and one of the probes may be pivoted out of the series circuit.
Public/Granted literature
- US20080309347A1 CIRCUIT TESTER DEVICE Public/Granted day:2008-12-18
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