Invention Grant
- Patent Title: Methods and systems for detecting a capacitance using sigma-delta measurement techniques
- Patent Title (中): 使用Σ-Δ测量技术检测电容的方法和系统
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Application No.: US12252150Application Date: 2008-10-15
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Publication No.: US07683641B2Publication Date: 2010-03-23
- Inventor: Kirk Hargreaves , Joseph Kurth Reynolds , David Ely , Julian Haines
- Applicant: Kirk Hargreaves , Joseph Kurth Reynolds , David Ely , Julian Haines
- Applicant Address: US CA Santa Clara
- Assignee: Synaptics Incorporated
- Current Assignee: Synaptics Incorporated
- Current Assignee Address: US CA Santa Clara
- Agency: Ingrassia, Fisher & Lorenz, P.C.
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta measurement techniques. According to various embodiments, a voltage is applied to the measurable capacitance using a first switch. The measurable capacitance is allowed to share charge with a passive network. If the charge on the passive network is past a threshold value, then the charge on the passive network is changed by a known amount for a sufficient number of repetitions until the measurable capacitance can be detected. Such a detection scheme may be readily implemented using conventional components, and can be particularly useful in sensing the position of a finger, stylus or other object with respect to a button, slider, touchpad or other input sensor.
Public/Granted literature
- US20090039902A1 METHODS AND SYSTEMS FOR DETECTING A CAPACITANCE USING SIGMA-DELTA MEASUREMENT TECHNIQUES Public/Granted day:2009-02-12
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