Invention Grant
- Patent Title: Calibration circuit of on-die termination device
- Patent Title (中): 管芯端接装置的校准电路
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Application No.: US12099350Application Date: 2008-04-08
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Publication No.: US07683657B2Publication Date: 2010-03-23
- Inventor: Ki-Ho Kim
- Applicant: Ki-Ho Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Hybix Semiconductor, Inc.
- Current Assignee: Hybix Semiconductor, Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Law Firm PLC
- Priority: KR10-2007-0128238 20071211
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/003

Abstract:
A calibration circuit of an on-die termination device includes a code generating unit configured to receive a voltage of a calibration node and a reference voltage, to generate calibration codes. The calibration unit also includes a calibration resistor unit having parallel resistors which are turned on/off in response to each of the calibration codes and connected to the calibration node, a turn-on strength of at least one of the parallel resistors being controlled by a control signal.
Public/Granted literature
- US20090146683A1 CALIBRATION CIRCUIT OF ON-DIE TERMINATION DEVICE Public/Granted day:2009-06-11
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