Invention Grant
- Patent Title: Equalizing reference surface capacitance with uneven thickness
- Patent Title (中): 使参考表面电容均匀,厚度不均匀
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Application No.: US11316556Application Date: 2005-12-22
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Publication No.: US07683891B2Publication Date: 2010-03-23
- Inventor: Bich Quy Tran
- Applicant: Bich Quy Tran
- Applicant Address: US CA Santa Clara
- Assignee: Synaptics Incorporated
- Current Assignee: Synaptics Incorporated
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F3/041
- IPC: G06F3/041

Abstract:
One embodiment in accordance with the invention includes a capacitive sensing apparatus that includes a capacitive sensor configured to sense an object proximate to a physical capacitive sensing reference surface. The capacitive sensing apparatus also includes a plurality of dielectric materials disposed between the capacitive sensor and the physical capacitive sensing reference surface. Note that at least one of the plurality of dielectric materials has a non-uniform thickness. The plurality of dielectric materials can be configured such that capacitive coupling between the capacitive sensor and the object proximate to the physical capacitive sensing reference surface is substantially constant across the physical capacitive sensing reference surface.
Public/Granted literature
- US20070144795A1 Equalizing reference surface capacitance with uneven thickness Public/Granted day:2007-06-28
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