Invention Grant
- Patent Title: Scanning microscopy
- Patent Title (中): 扫描显微镜
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Application No.: US11559741Application Date: 2006-11-14
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Publication No.: US07684048B2Publication Date: 2010-03-23
- Inventor: Doron Meshulach , Haim Feldman
- Applicant: Doron Meshulach , Haim Feldman
- Applicant Address: IL Rehovot
- Assignee: Applied Materials Israel, Ltd.
- Current Assignee: Applied Materials Israel, Ltd.
- Current Assignee Address: IL Rehovot
- Agency: Sonnenschein Nath & Rosenthal LLP
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
Apparatus for imaging a surface, including scanning optics, which are configured to scan and focus one or more traveling beams onto the surface so as to form one or more traveling spots thereon. The apparatus also includes collection optics, which are arranged to collect radiation scattered from the one or more traveling spots and to focus the radiation to form one or more image spots traveling along a line. The apparatus also has a detecting assembly, which consists of a detector which is configured to generate a signal in response to the one or more traveling image spots, and a detector entry port interposed between the collection optics and the detector, which is coincident with the line. The apparatus also includes phase and/or polarization altering elements for the traveling beams.
Public/Granted literature
- US20070109546A1 Scanning Microscopy Public/Granted day:2007-05-17
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