Invention Grant
US07684050B2 Shape measuring apparatus, shape measuring method, and exposure apparatus
有权
形状测量装置,形状测量方法和曝光装置
- Patent Title: Shape measuring apparatus, shape measuring method, and exposure apparatus
- Patent Title (中): 形状测量装置,形状测量方法和曝光装置
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Application No.: US11942348Application Date: 2007-11-19
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Publication No.: US07684050B2Publication Date: 2010-03-23
- Inventor: Takahiro Matsumoto , Ryo Sasaki
- Applicant: Takahiro Matsumoto , Ryo Sasaki
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc IP Division
- Priority: JP2006-346203 20061222; JP2007-278962 20071026
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
A shape measuring method for measuring a surface shape of a measurement target includes dividing light from a light source into measurement light and reference light, the measurement light being obliquely incident upon a surface of the measurement target, the reference light being incident upon a reference mirror, introducing the measurement light reflected by the measurement target and the reference light reflected by the reference mirror to a photoelectric conversion element, detecting interference light formed by the measurement light and the reference light by the photoelectric conversion element while moving the measurement target, and measuring the surface shape of the measurement target based on an interference signal obtained from the measurement light that has been reflected at the same position on the surface of the measurement target.
Public/Granted literature
- US20080151258A1 SHAPE MEASURING APPARATUS, SHAPE MEASURING METHOD, AND EXPOSURE APPARATUS Public/Granted day:2008-06-26
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